Current diagnosis technology can be further divided into static current diagnosis and dynamic current diagnosis

Current diagnosis technology can be divided into static current diagnosis and dynamic current diagnosis. The core of static current diagnosis technology is to compare the power supply current of the tested circuit in a stable operating state with a pre-set threshold to determine whether there is a fault in the tested circuit. It can be seen that the selection of threshold is the key to determining the detection rate of this method. Early static current diagnosis techniques used fixed thresholds, but fixed thresholds were not suitable for the development of integrated circuit chips towards deep submicron technology. So, later generations continuously improved the static current detection method, and successively proposed differential static current detection technology, current ratio diagnosis method, static current detection technology based on clustering technology, etc. Dynamic current diagnosis technology was introduced in the 1990s. Dynamic current can directly reflect the frequency of internal voltage switching in a circuit during state transition. The detection technology based on dynamic current can detect faults that cannot be detected by the previous two methods, further expanding the fault coverage range. With the development and gradual maturity of intelligent technology, integrated circuit chip fault detection technology is also moving towards the trend of intelligence