The observation information of voltage testing is the logical output value of the tested circuit[Detailed]

Voltage diagnosis appeared earlier and is widely used. The observation information of voltage testing is the logical output value of the tested circuit. This method obtains the corresponding logic output value of the circuit by inputting different test vectors into the circuit, and then compares the collected circuit logic outpu...[Detailed]

The earliest circuit fault diagnosis methods mainly relied on simple tools for testing and diagnosis, which greatly relied on the theoretical knowledge and experience of experts or technicians. Among these testing methods, the four most commonly used are virtual testing, functional testing, structural testing, and defect and fau...[Detailed]

The hardware defects of integrated circuit chips usually refer to the physical imperfections exhibited by the chips. Integrated circuit fault refers to a circuit logic functional error or abnormal circuit operation caused by an integrated circuit defect. The common factors that cause failures in integrated circuit chips include ...[Detailed]